Measurement of Mechanical Resonance and Losses in Nanometer Scale Silicon Wires

D. W. Carr, S. Evoy, L. Sekaric, H. G. Craighead and J. M. Parpia,

Appl. Phys. Lett. 75, 920 (1999); http://dx.doi.org/10.1063/1.124554

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